Photothermal deflection measurement on heat transport in GaAs epitaxial layers
نویسندگان
چکیده
منابع مشابه
Photothermal deflection studies of GaAs epitaxial layers.
Photothermal beam deflection studies were carried out with GaAs epitaxial double layers grown on semi-insulating GaAs substrates. The impurity densities in thin epitaxial layers were found to influence the effective thermal diffusivity of the entire structure.
متن کاملSpin lifetime in InAs epitaxial layers grown on GaAs
We report investigation of the spin relaxation in InAs films grown on GaAs at a temperature range from 77 K to 290 K. InAs is known to have a surface accumulation layer and the depth profile of the concentration and mobility is strongly nonuniform. We have correlated the spin relaxation with a multilayer analysis of the transport properties and find that the surface and the interface with the G...
متن کاملPhotothermal cantilever deflection spectroscopy
Microcantilever sensors offer high sensitivity in the detection of adsorbed molecules based either on resonance frequency shift or changes in cantilever deflection, as both of these signals can be detected with very high resolution. Despite the high sensitivity offered by this platform, cantilevers suffer from poor selectivity due to the lack of sufficiently selective interfacial layers which c...
متن کاملTime Resolved Photothermal Deflection Measurement of Semiconductormaterials Thermal Parameters
A time resolved measurement of the thermaly induced surface deformation has been carried out using visible light-based photothermal deflection technique. Thermal conductivity coefficients were determined for several semiconductor materials. Problems of the experimental data interpretation with respect to the effect of 2D/3D heat source excitation and the potential advantages of the time resolve...
متن کاملPhotothermal deflection spectroscopy and detection.
The theory for a sensitive spectroscopy based on the photothermal deflection of a laser beam is developed. We consider cw and pulsed cases of both transverse and collinear photothermal deflection spectroscopy for solids, liquids, gases, and thin films. The predictions of the theory are experimentally verified, its implications for imaging and microscopy are given, and the sources of noise are a...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Physical Review B
سال: 2003
ISSN: 0163-1829,1095-3795
DOI: 10.1103/physrevb.68.165319